Gold Member Since 2015
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Zhengzhou Nanbei Instrument Equipment Co., Ltd.

Afm Microscope, Atomic Force Microscope, Research Afm Microscope manufacturer / supplier in China, offering Solid Surface Research Machine Atomic Force Microscope, LED Optical 1000X Scanning Electron Microscope with Projector, Price of Inverted Digital Biological Digital Microscope and so on.

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Solid Surface Research Machine Atomic Force Microscope

FOB Price: US $9,500-15,000 / Set
Min. Order: 1 Set
Min. Order FOB Price
1 Set US $9,500-15,000/ Set
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Port: Shanghai, China
Production Capacity: 200set a Month
Payment Terms: L/C, T/T, D/P, Western Union, Money Gram

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Basic Info
  • Model NO.: AFM
  • Type: Stereomicroscope
  • Mobility: Desktop
  • Kind of Light Source: Laser
  • Usage: Teaching
  • Principle of Optics: Phase Contrast Microscope
  • Work Mode: FM-Tapping, Optional Contact, Friction, Phase,Magn
  • Scanningrange: 20 Mmin Xydirection,2 mm in Z Direction.
  • Image Sampling Point: 256*256,512*512
  • Scanrate: 0.6Hz~4.34Hz
  • Feedback: DSP Digital Feedback
  • Transport Package: Wooden Case Package
  • Origin: China(Mainland)
  • Magnification: 4X
  • Number of Cylinder: No
  • Stereoscopic Effect: Stereoscopic Effect
  • Shape: Pentagonal Prism
  • Principle: Optics
  • Name: Atomic Force Microscope
  • Size: 90mm*20m
  • Movementrange of Sample: ±6.5mm
  • Optical Magnification: 4X
  • Scanangle: 0°~360°
  • Trademark: nanbei
  • Specification: 54*55*99cm
  • HS Code: 9012100000
Product Description
Solid surface research machine atomic force microscope

 Integrated scanning probe and sample stagenhanced the anti-interference ability.
2  Precision laser and probe positioning device make changing the probe andadjusting the spot simple and convenient.
3. By using the sample probe approaching manner,the needle could perpendicular to thesample scanning.       
4.   Automaticpulse motor drive control sample probe vertical approaching, to achieve precisepositioning of the scanning area.
5.   Samplescanning area of interest could freely moved by using the design of highprecision sample mobile device.
6.   CCDobservation system with optical positioning achieves real-time observation andpositioning of the probe sample scan area.
7.   Thedesign of electronic control system of modularization facilitated maintenanceand continuous improvement of circuit.
8.   Theintegration of multiple scanning mode control circuit, cooperate with softwaresystem.
9.    Spring suspension which simple and practicalenhanced anti-interference ability.

Work mode: FM-Tapping, optional contact, friction, phase,magnetic or electrostatic
3,Scanningrange:20 mmin XYdirection,2 mm in Z direction.
4,Scanningresolution:0.2nm in XY direction,0.05nm in Z direction.
5,Movementrange of sample:±6.5mm.
6,Pulse width ofthe motor approaches:10±2ms.
7,Image sampling point:256×256,512×512.
8,  optical magnification 4X,opticalresolution 2.5 mm.
9,Scanrate 0.6Hz~4.34Hz,scanangle 0°~360°.
10,Scanningcontrol : 18-bit D/A in XY direction,16-bit D/A in Z direction.
11,Datasampling:14-bitA/D,double16-bit A/D multi-channel synchronous sampling.
12,Feedback:DSP digital feedback.
13,Feedbacksampling rate:64.0KHz.
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