Gold Member Since 2015
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Zhengzhou Nanbei Instrument Equipment Co., Ltd.

Atomic Microscope, Afm Microscope, Afm Instrument manufacturer / supplier in China, offering Afm Image Analysis Instrument Atomic Microscope, LED Optical 1000X Scanning Electron Microscope with Projector, Price of Inverted Digital Biological Digital Microscope and so on.

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Afm Image Analysis Instrument Atomic Microscope

FOB Price: US $10,000-15,000 / Set
Min. Order: 1 Set
Min. Order FOB Price
1 Set US $10,000-15,000/ Set
Get Latest Price
Port: Shanghai, China
Production Capacity: 200set a Month
Payment Terms: L/C, T/T, D/P, Western Union, Money Gram

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Basic Info
  • Model NO.: AFM1000
  • Type: Stereomicroscope
  • Mobility: Desktop
  • Kind of Light Source: Laser
  • Usage: Teaching
  • Principle of Optics: Phase Contrast Microscope
  • Work Mode: FM-Tapping, Optional Contact, Friction, Phase,Magn
  • Scanningrange: 20 Mmin Xydirection,2 mm in Z Direction.
  • Image Sampling Point: 256*256,512*512
  • Scanrate: 0.6Hz~4.34Hz
  • Feedback: DSP Digital Feedback
  • Transport Package: Wooden Case Package
  • Origin: China(Mainland)
  • Magnification: 4X
  • Number of Cylinder: No
  • Stereoscopic Effect: Stereoscopic Effect
  • Shape: Pentagonal Prism
  • Principle: Optics
  • Name: Atomic Microscope
  • Size: 90mm*20m
  • Movementrange of Sample: ±6.5mm
  • Optical Magnification: 4X
  • Scanangle: 0°~360°
  • Trademark: nanbei
  • Specification: 54*55*99cm
  • HS Code: 9012100000
Product Description
afm image analysis instrument atomic microscope

 Integrated scanning probe and sample stagenhanced the anti-interference ability.
2  Precision laser and probe positioning device make changing the probe andadjusting the spot simple and convenient.
3. By using the sample probe approaching manner,the needle could perpendicular to thesample scanning.       
4.   Automaticpulse motor drive control sample probe vertical approaching, to achieve precisepositioning of the scanning area.
5.   Samplescanning area of interest could freely moved by using the design of highprecision sample mobile device.
6.   CCDobservation system with optical positioning achieves real-time observation andpositioning of the probe sample scan area.
7.   Thedesign of electronic control system of modularization facilitated maintenanceand continuous improvement of circuit.
8.   Theintegration of multiple scanning mode control circuit, cooperate with softwaresystem.
9.    Spring suspension which simple and practicalenhanced anti-interference ability.

Work modeFM-Tapping, optional contact, friction, phase,magnetic or electrostatic
Scanningrange20 mmin XYdirection,2 mm in Z direction
Scanningresolution0.2nm in XY direction,0.05nm in Z direction
Movementrange of sample±6.5mm
Pulse width ofthe motor approaches10±2ms
Image sampling point256×256,512×512.
 optical magnification4X
opticalresolution 2.5 um
Scanningcontrol 18-bit D/A in XY direction,16-bit D/A in Z direction.
Datasampling14-bitA/D,double16-bit A/D multi-channel synchronous sampling.
FeedbackDSP digital feedback
Feedbacksampling rate64.0KHz

Afm Image Analysis Instrument Atomic Microscope

Afm Image Analysis Instrument Atomic Microscope

Package & Shipping
Package : Wooden case package
Shipping : 5days
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Afm Image Analysis Instrument Atomic Microscope

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Afm Image Analysis Instrument Atomic Microscope
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