Gold Member Since 2015
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Zhengzhou Nanbei Instrument Equipment Co., Ltd.

Afm Microscopy, Atomic Force Microscopy, Research Afm Microscopu manufacturer / supplier in China, offering Scientific Research Afm Atomic Force Microscopy, Chemical Use Heating Lab Magnetic Mixing Machine, Protein Analysis Automatic Kjeldahl Nitrogen Analyzer and so on.

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Scientific Research Afm Atomic Force Microscopy

FOB Price: US $13,000-15,000 / Set
Min. Order: 1 Set
Min. Order FOB Price
1 Set US $13,000-15,000/ Set
Get Latest Price
Production Capacity: 200set a Month
Transport Package: Wooden Case Package
Payment Terms: L/C, T/T, D/P, Western Union, Money Gram

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Basic Info
  • Model NO.: 6800
  • Type: Stereomicroscope
  • Mobility: Desktop
  • Kind of Light Source: Laser
  • Usage: Teaching
  • Principle of Optics: Phase Contrast Microscope
  • Work Mode: FM-Tapping, Optional Contact, Friction, Phase,Magn
  • Scanningrange: 20 Mmin Xydirection,2 mm in Z Direction.
  • Image Sampling Point: 256*256,512*512
  • Scanrate: 0.6Hz~4.34Hz
  • Feedback: DSP Digital Feedback
  • Specification: 54*55*99cm
  • HS Code: 9012100000
  • Magnification: 4X
  • Number of Cylinder: No
  • Stereoscopic Effect: Stereoscopic Effect
  • Shape: Pentagonal Prism
  • Principle: Optics
  • Name: Atomic Force Microscopy
  • Size: 90mm*20m
  • Movementrange of Sample: ±6.5mm
  • Optical Magnification: 4X
  • Scanangle: 0°~360°
  • Trademark: nanbei
  • Origin: China(Mainland)
Product Description
Scientific research afm atomic force microscopy

 FEATURES
 Integrated scanning probe and sample stagenhanced the anti-interference ability.
2  Precision laser and probe positioning device make changing the probe andadjusting the spot simple and convenient.
3. By using the sample probe approaching manner,the needle could perpendicular to thesample scanning.       
4.   Automaticpulse motor drive control sample probe vertical approaching, to achieve precisepositioning of the scanning area.
5.   Samplescanning area of interest could freely moved by using the design of highprecision sample mobile device.
6.   CCDobservation system with optical positioning achieves real-time observation andpositioning of the probe sample scan area.
7.   Thedesign of electronic control system of modularization facilitated maintenanceand continuous improvement of circuit.
8.   Theintegration of multiple scanning mode control circuit, cooperate with softwaresystem.
9.    Spring suspension which simple and practicalenhanced anti-interference ability.

MAIN SPECIFICATIONS:
Work modeFM-Tapping, optional contact, friction, phase,magnetic or electrostatic
SizeΦ≤90mm,H≤20mm
Scanning range20 mmin XYdirection,2 mm in Z direction
Scanning resolution0.2nm in XY direction,0.05nm in Z direction
Movementrange of sample±6.5mm
Pulse width ofthe motor approaches10±2ms
Image sampling point256×256,512×512
optical magnification4X,opticalresolution 2.5 mm
Scan rate0.6Hz~4.34Hz,scanangle 0°~360°
Scanning control18-bit D/A in XY direction,16-bit D/A in Z direction
Data sampling14-bitA/D,double16-bit A/D multi-channel synchronous sampling
FeedbackDSP digital feedback
Feedback sampling rate64.0KHz
Computer interfaceUSB2.0
Operating environmentWindows98/2000/XP/7/8.
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