Gold Member Since 2015
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Zhengzhou Nanbei Instrument Equipment Co., Ltd.

Afm, Afm Microscope, Atomic Force Microscope manufacturer / supplier in China, offering High School Teaching Purpose Atomic Force Microscope, Factory Cheap Price for Weather Recorder PAR Meter, Cheap Price Portable Leaf Area Meter and so on.

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High School Teaching Purpose Atomic Force Microscope

FOB Price: US $9,500-15,000 / Set
Min. Order: 1 Set
Min. Order FOB Price
1 Set US $9,500-15,000/ Set
Get Latest Price
Production Capacity: 200set a Month
Transport Package: Wooden Case Package
Payment Terms: L/C, T/T, D/P, Western Union, Money Gram

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Basic Info
  • Model NO.: AFM
  • Type: Stereomicroscope
  • Mobility: Desktop
  • Kind of Light Source: Laser
  • Usage: Teaching
  • Principle of Optics: Phase Contrast Microscope
  • Work Mode: FM-Tapping, Optional Contact, Friction, Phase,Magn
  • Scanningrange: 20 Mmin Xydirection,2 mm in Z Direction.
  • Image Sampling Point: 256*256,512*512
  • Scanrate: 0.6Hz~4.34Hz
  • Feedback: DSP Digital Feedback
  • Specification: 54*55*99cm
  • HS Code: 9012100000
  • Magnification: 4X
  • Number of Cylinder: No
  • Stereoscopic Effect: Stereoscopic Effect
  • Shape: Pentagonal Prism
  • Principle: Optics
  • Name: Atomic Force Microscope
  • Size: 90mm*20m
  • Movementrange of Sample: ±6.5mm
  • Optical Magnification: 4X
  • Scanangle: 0°~360°
  • Trademark: nanbei
  • Origin: China(Mainland)
Product Description
High school teaching purpose atomic force microscope

 FEATURES
 Integrated scanning probe and sample stagenhanced the anti-interference ability.
2  Precision laser and probe positioning device make changing the probe andadjusting the spot simple and convenient.
3. By using the sample probe approaching manner,the needle could perpendicular to thesample scanning.       
4.   Automaticpulse motor drive control sample probe vertical approaching, to achieve precisepositioning of the scanning area.
5.   Samplescanning area of interest could freely moved by using the design of highprecision sample mobile device.
6.   CCDobservation system with optical positioning achieves real-time observation andpositioning of the probe sample scan area.
7.   Thedesign of electronic control system of modularization facilitated maintenanceand continuous improvement of circuit.
8.   Theintegration of multiple scanning mode control circuit, cooperate with softwaresystem.
9.    Spring suspension which simple and practicalenhanced anti-interference ability.

MAIN SPECIFICATIONS:
Work mode: FM-Tapping, optional contact, friction, phase,magnetic or electrostatic
2,Size:Φ≤90mm,H≤20mm
3,Scanningrange:20 mmin XYdirection,2 mm in Z direction.
4,Scanningresolution:0.2nm in XY direction,0.05nm in Z direction.
5,Movementrange of sample:±6.5mm.
6,Pulse width ofthe motor approaches:10±2ms.
7,Image sampling point:256×256,512×512.
8,  optical magnification 4X,opticalresolution 2.5 mm.
9,Scanrate 0.6Hz~4.34Hz,scanangle 0°~360°.
10,Scanningcontrol : 18-bit D/A in XY direction,16-bit D/A in Z direction.
11,Datasampling:14-bitA/D,double16-bit A/D multi-channel synchronous sampling.
12,Feedback:DSP digital feedback.
13,Feedbacksampling rate:64.0KHz.
14,Computerinterface:USB2.0.
15,Operatingenvironment:Windows98/2000/XP/7/8.
 
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