High Resolution Atomic Force Microscope Afm for Nanoscale Surface Analysis

NANBEI INSTRUMENT LIMITED
  • Audited Supplier
  • 12 yrs

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Product Highlights

  • Anti-Breakage Design: Sample approaches probe mode to protect cantilever from breakage during misoperation.
  • High Precision Scanning: 0.2nm XY and 0.05nm Z resolution with 50x50um XY and 5um Z scanning range.
  • Real-Time Observation: 10x apochromat CCD optical system enables real-time sample positioning and observation.
  • Modular Control System: Modular electronic design facilitates easy maintenance and continuous system improvement.
  • Flexible Work Modes: Supports FM-tapping, contact, friction, phase, magnetic, and electrostatic modes.
  • Wide Scanning Range: Alternative scanning ranges available: 20x20um XY and 2um Z for different precision needs.
  • Professional Manufacturer: Over 13 years experience with exports to more than 97% of countries worldwide.
  • Comprehensive Warranty: 1-year warranty with free parts for quality problems and long-life technical support.

Product Images of High Resolution Atomic Force Microscope Afm for Nanoscale Surface Analysis

High Resolution Atomic Force Microscope Afm for Nanoscale Surface Analysis pictures & photos
High Resolution Atomic Force Microscope Afm for Nanoscale Surface Analysis
High Resolution Atomic Force Microscope Afm for Nanoscale Surface Analysis pictures & photos
High Resolution Atomic Force Microscope Afm for Nanoscale Surface Analysis
High Resolution Atomic Force Microscope Afm for Nanoscale Surface Analysis pictures & photos
High Resolution Atomic Force Microscope Afm for Nanoscale Surface Analysis
  • High Resolution Atomic Force Microscope Afm for Nanoscale Surface Analysis
    High Resolution Atomic Force Microscope Afm for Nanoscale Surface Analysis
  • High Resolution Atomic Force Microscope Afm for Nanoscale Surface Analysis
    High Resolution Atomic Force Microscope Afm for Nanoscale Surface Analysis
  • High Resolution Atomic Force Microscope Afm for Nanoscale Surface Analysis
    High Resolution Atomic Force Microscope Afm for Nanoscale Surface Analysis

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Product Description

Product Description

FEATURES:

1:  Optical,mechanical and electronic integration, simple outline structure.
2: Integrated scanning probe and sample stage improvesthe anti-interference ability.
3:  Precisionlaser and probe positioning device make changing the probe and adjusting thespot simple and convenient.
4: Differentwith other suppliers, our device changes the sample probe approaching sample modeto the sample approching probe mode. It's a really effecient way to protect thecantiliver broken from missoperation.
5. Automaticstep motor drive controls the sample probe vertical approaching, to achieve precisepositioning of the scanning area.
6. Samplescanning area of interest may be freely moved by using an high precision wide-rangeX-Y stage.
7. Highprecision and wide range piezo-scanner, multiple choice according to differentprecision andscanning range .
8. 10xapochromat CCD optical positioning system achieve real-time observation andpositioning of the sample scan area.
9. Thedesign of the modular electronic control system facilitates maintenance andcontinuous improvement.

Detailed Photos

High Resolution Atomic Force Microscope Afm for Nanoscale Surface Analysis

Product Parameters

 

Work mode FM-tapping, optional contact, friction,phase,magnetic or electrostatic
Size Φ≤90 mm,H≤20 mm
Scanning range 50mm in XYdirection,5 mm in Z direction,  alternative: 20 mm in XY direction,2mm in Z direction
Scanning resolution 0.2nm in XY direction,0.05nm in Z direction
Movement range of sample ±10mm
Pulse width of the motor approaching 10±2ms
Image sampling points 256×256,512×512
Optical magnification 10X,optical resolution 1 mm
Scan rate 0.6Hz~4.34Hz
Scan angle 0°~360°
Scanning control 18-bit D/A in XY direction,16-bit D/A in Z direction
Data sampling 14-bitA/D,double16-bit A/D multi-channel synchronous sampling
Feedback DSP digital feedback
Feedback sampling rate 64.0KHZ
Computer interface USB2.0
Operating system Windows98/2000/XP/7/8


Application
High Resolution Atomic Force Microscope Afm for Nanoscale Surface AnalysisHigh Resolution Atomic Force Microscope Afm for Nanoscale Surface AnalysisHigh Resolution Atomic Force Microscope Afm for Nanoscale Surface Analysis

Packaging & Shipping

High Resolution Atomic Force Microscope Afm for Nanoscale Surface Analysis

Company Profile

High Resolution Atomic Force Microscope Afm for Nanoscale Surface Analysis

Certifications

High Resolution Atomic Force Microscope Afm for Nanoscale Surface Analysis

FAQ

FAQ
Q1: Why Choose NANBEI ?
(1).Professional manufacturer with more than 18 years experience
(2).Exported to more than 97% Countries
(3).Turnkey Solution is no problem

Q2:OEM,ODM acceptable or not?
Absolutely Yes

Q3:What's kind of Payment terms for customer choosing?
T/T ,Western Union, Money Gram , Credit Card, Paypal , L/C ...

Q4:Can we visit your factory online?
Absolutely no problem

Q5:Can online video inspection before shipment?
Absolutely no problem

Q6: what's the MOQ ? Sample order is OK?
MOQ:1 set, sample order is no problem

Q7:What's kind of shipment for customer choosing?
Usually ship by sea, by air, by international express .
We can also provide reasonable solutions according to your transportation requirements

Q8:How to ensure product quality and after-sales service?
We have CE, ISO quality certificate, and SGS authentication.

After-sale service:
1.Warranty : 1 year
2.We supply free part for quality problem in warranty
3.Long life technical support and service

 

About the Supplier

This supplier has been audited by BV. Verify the report on the official BV website with ID "MIC-ASR269198". Items marked "verified" are certified.

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NANBEI INSTRUMENT LIMITED
NANBEI INSTRUMENT LIMITED
NANBEI INSTRUMENT LIMITED
NANBEI INSTRUMENT LIMITED
NANBEI INSTRUMENT LIMITED
NANBEI INSTRUMENT LIMITED
NANBEI INSTRUMENT LIMITED
NANBEI INSTRUMENT LIMITED

About Our Factory & Business Background

Address
No.72, Beihuan Road, Zhengzhou, Henan, China
Terms of Payment
LC, T/T, D/P, PayPal, Western Union, Small-amount payment, Money Gram, pay online
International Commercial Terms(Incoterms)
FOB, EXW, CFR, CIF, DAT, FAS, DDP, DAP, CIP, CPT, Others, FCA
Average Lead Time
Peak Season Lead Time: within 15 workdays
Off Season Lead Time: within 15 workdays
Nearest Port
Shanghai, Qingdao

Our Production Capability & Technical Expertise

Main Products
Laboratory Instrument, Rotary Evaporator, Glass Reactor, Life Science Instruments, Agricultural Instruments, Chemical Analysis Equipments, Thermal Cycler PCR, Petroleum Instruments, Drug Testing Equipment, Physical Testing Instruments

Our Industry Experience & Global Business Record

Export Year
2013-06-06
Main Markets
North America, South America, Eastern Europe, Southeast Asia, Africa, Oceania, Mid East, Eastern Asia, Western Europe

FAQ

What are the main specifications of the AFM?
Scanning range is 50x50um in XY and 5um in Z. Resolution is 0.2nm in XY and 0.05nm in Z. Sample size is Dia: 90mm, H<20mm. Work modes include FM-tapping, contact, friction, phase, magnetic, or electrostatic.
Is OEM and ODM service available?
Yes, OEM and ODM services are absolutely acceptable.
What is the minimum order quantity (MOQ)?
The MOQ is 1 set. Sample orders are also acceptable.
What payment terms are supported?
We accept T/T, Western Union, Money Gram, Credit Card, PayPal, and L/C.
What is the warranty period and after-sales service?
We provide a 1-year warranty. During the warranty period, we supply free parts for quality problems. We also offer long-life technical support and service.
Can I visit the factory or inspect the product online?
Yes, you can visit our factory online and conduct online video inspections before shipment without any problems.
What are the shipping options?
We usually ship by sea, air, or international express. We can also provide reasonable solutions based on your specific transportation requirements.
What certifications does the product have?
The product has CE, ISO quality certificates, and SGS authentication.

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