| Customization: | Available |
|---|---|
| After-sales Service: | on Line Service |
| Application: | Laboratory Apparatus |
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752N Visible / UV spectrophotometer with CE approved
The product uses microprocessor control technology in the UV-visible spectral region of the material for qualitative and quantitative analysis, is a conventional laboratory necessary multi-purpose analytical instruments.
Main feature:
holographic sparkle grating monochromator, with high wavelength accuracy, monochromatic, stray light low and so on.
With a backlit LCD monitor, the measurement data at a glance.
With microcomputer measurement system, T-A conversion accuracy is high, and there are automatic 0% T and
Adjust the concentration of 100% T, the concentration factor set, the concentration of direct reading.
High accuracy of measurement readings, good reproducibility and good stability.
Optional:
Serial printer
Dedicated analysis software
Other:
Light source: 12V20W halogen lamp and de*uterium lamp
Power supply voltage: AC220V ± 22V 50Hz ± 1Hz
Power: 120W






Technical indicators:
| Model | 752N |
| Metering mode: | single beam |
| Monochromator: | self-collimation |
| Focal length: | 160mm |
| Grating: | 1200 lines / mm |
| Detector: | photocell |
| Spectral bandwidth: | 4nm |
| Wavelength setting: | The knob is manually adjusted |
| Wavelength range: | 200 - 1000nm |
| Wavelength Accuracy: | ± 2nm |
| Wavelength repeatability: | ≤1nm |
| Light source switching wavelength: | 340nm |
| stray light: | ≤ 0.3% (T) (measured at N2O at 220 nm) |
| (Measured at 360 nm with NaNO2) | |
| Photometric range: |
0.0 ~ 200.0% T |
| 0 ~ 2.000A | |
| 0.000 to 9999C | |
| Photometric accuracy: |
± 0.5% T |
| ± 0.004Abs (0 - 0.5A) | |
| 0.004Abs (0.5 -1 A) | |
| Photometric repeatability: |
≤ 0.2% T |
| 0.002Abs (0 - 0.5A) | |
| 0.004Abs (0.5 -1 A) | |
| Noise: | 0.3% T |

| metering mode | double beam |
| Monochromator | Czerny - Turner |
| Focal length | 200mm |
| Grating | 1600 lines / mm |
| Detector | photocell |
| Spectral bandwidth | 2nm |
| Wavelength setting | Touch screen input |
| Wavelength range | 190 - 1100nm |
| Wavelength Accuracy | ± 0.3nm |
| Wavelength repeatability | ≤ 0.1nm |
| Wavelength scanning speed | fast, medium and slow |
| Light source switching wavelength | 340nm |
| Stray light | ≤ 0.02% (measured by NaI at 220 nm) (measured at NaNO2 at 360 nm) |
| Photometric range: | 0.0 ~ 200.0% T -0.301 ~ 4.000A 0.000 to 9999C |
| Photometric accuracy: | ± 0.3% T ± 0.002Abs (0 - 0.5A) ± 0.004Abs (0.5 - 1A) |
| Photometric repeatability: | ≤ 0.15% T 0.001Abs (0 - 0.5A) 0.002Abs (0.5 - 1A) |
| Baseline flatness: | ≤ ± 0.0008A |
| Noise: | 0.1% T |
| Baseline drift: | ± 0.0004 (A / h) at 250nm and 500nm (preheat for 2 hours) |
| Power supply voltage: | AC220V ± 22V 50Hz ± 1Hz |
| Power: | 200W |
| metering mode | the proportion of dual-beam |
| Monochromator | Czerny - Turner |
| Focal length | 160mm |
| Grating | 1200 lines / mm |
| Detector | photocell |
| Spectral bandwidth | 2nm |
| Wavelength setting | Touch screen input |
| Wavelength range | 190 - 1100nm |
| Wavelength Accuracy | ± 0.5nm |
| Wavelength repeatability | ≤ 0.2nm |
| wavelength scanning speed | fast, medium and slow (limited to S models) |
| Light source switching wavelength | 340nm |
| Stray light | ≤ 0.03% (T) (measured at Nil in 220 nm) (measured at NaNO2 at 360 nm) |
| Photometric range: | 0.0 ~ 200.0% T -0.301 ~ 4.000A 0.000 to 9999C |
| Photometric accuracy: | ± 0.3% T ± 0.002Abs (0 - 0.5A) ± 0.004Abs (0.5 - 1A) |
| Photometric repeatability: | ≤ 0.15% T 0.001Abs (0 - 0.5A) 0.002Abs (0.5 - 1A) |
| Baseline flatness: | ≤ ± 0.002A (200nm ~ 1090nm) (limited to S) |
| Noise: | 0.15% T |
| Baseline drift: | ± 0.0009Abs / 0.5h (limited to S) (after 2h boot, 250nm and 500nm) |
| Metering mode | single beam |
| Monochromator | self-collimation |
| Focal length | 160mm |
| Grating | 1200 lines / mm |
| Detector | photocell |
| Spectral bandwidth | 2nm |
| Wavelength setting | Touch screen input |
| Wavelength range | 190 - 1100nm |
| Wavelength Accuracy | ± 1nm |
| Wavelength repeatability | ≤ 0.5nm |
| Wavelength scanning speed | fast, medium and slow |
| Light source switching wavelength | 340nm |
| Stray light | ≤ 0.1% (T) (measured at Nil in 220 nm) (measured at NaNO2 at 360 nm) |
| Photometric range |
0.0 ~ 200.0% T |
| -0.301 ~ 4.000A | |
| 0.000 to 9999C | |
| Photometric accuracy |
± 0.5% T |
| ± 0.004Abs (0 - 0.5A) | |
| ± 0.008Abs (0.5 - 1A) | |
| Photometric repeatability |
≤0.2% T |
| 0.002Abs (0 - 0.5A) | |
| 0.004Abs (0.5 -1 A) | |
| Baseline flatness | ≤ ± 0.003A (limited to S) |
| Noise | 100% (T) ≤ 0.2% (T) |
| 0% (T) ≤ 0.1% (T) | |
| Baseline drift | ± 0.004Abs / 0.5h (limited to S) |


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