Customization: | Available |
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After-sales Service: | on Line Service |
Application: | Laboratory Apparatus |
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752N Visible / UV spectrophotometer with CE approved
The product uses microprocessor control technology in the UV-visible spectral region of the material for qualitative and quantitative analysis, is a conventional laboratory necessary multi-purpose analytical instruments.
Main feature:
holographic sparkle grating monochromator, with high wavelength accuracy, monochromatic, stray light low and so on.
With a backlit LCD monitor, the measurement data at a glance.
With microcomputer measurement system, T-A conversion accuracy is high, and there are automatic 0% T and
Adjust the concentration of 100% T, the concentration factor set, the concentration of direct reading.
High accuracy of measurement readings, good reproducibility and good stability.
Optional:
Serial printer
Dedicated analysis software
Other:
Light source: 12V20W halogen lamp and de*uterium lamp
Power supply voltage: AC220V ± 22V 50Hz ± 1Hz
Power: 120W
Technical indicators:
Model | 752N |
Metering mode: | single beam |
Monochromator: | self-collimation |
Focal length: | 160mm |
Grating: | 1200 lines / mm |
Detector: | photocell |
Spectral bandwidth: | 4nm |
Wavelength setting: | The knob is manually adjusted |
Wavelength range: | 200 - 1000nm |
Wavelength Accuracy: | ± 2nm |
Wavelength repeatability: | ≤1nm |
Light source switching wavelength: | 340nm |
stray light: | ≤ 0.3% (T) (measured at N2O at 220 nm) |
(Measured at 360 nm with NaNO2) | |
Photometric range: |
0.0 ~ 200.0% T |
0 ~ 2.000A | |
0.000 to 9999C | |
Photometric accuracy: |
± 0.5% T |
± 0.004Abs (0 - 0.5A) | |
0.004Abs (0.5 -1 A) | |
Photometric repeatability: |
≤ 0.2% T |
0.002Abs (0 - 0.5A) | |
0.004Abs (0.5 -1 A) | |
Noise: | 0.3% T |
metering mode | double beam |
Monochromator | Czerny - Turner |
Focal length | 200mm |
Grating | 1600 lines / mm |
Detector | photocell |
Spectral bandwidth | 2nm |
Wavelength setting | Touch screen input |
Wavelength range | 190 - 1100nm |
Wavelength Accuracy | ± 0.3nm |
Wavelength repeatability | ≤ 0.1nm |
Wavelength scanning speed | fast, medium and slow |
Light source switching wavelength | 340nm |
Stray light | ≤ 0.02% (measured by NaI at 220 nm) (measured at NaNO2 at 360 nm) |
Photometric range: | 0.0 ~ 200.0% T -0.301 ~ 4.000A 0.000 to 9999C |
Photometric accuracy: | ± 0.3% T ± 0.002Abs (0 - 0.5A) ± 0.004Abs (0.5 - 1A) |
Photometric repeatability: | ≤ 0.15% T 0.001Abs (0 - 0.5A) 0.002Abs (0.5 - 1A) |
Baseline flatness: | ≤ ± 0.0008A |
Noise: | 0.1% T |
Baseline drift: | ± 0.0004 (A / h) at 250nm and 500nm (preheat for 2 hours) |
Power supply voltage: | AC220V ± 22V 50Hz ± 1Hz |
Power: | 200W |
metering mode | the proportion of dual-beam |
Monochromator | Czerny - Turner |
Focal length | 160mm |
Grating | 1200 lines / mm |
Detector | photocell |
Spectral bandwidth | 2nm |
Wavelength setting | Touch screen input |
Wavelength range | 190 - 1100nm |
Wavelength Accuracy | ± 0.5nm |
Wavelength repeatability | ≤ 0.2nm |
wavelength scanning speed | fast, medium and slow (limited to S models) |
Light source switching wavelength | 340nm |
Stray light | ≤ 0.03% (T) (measured at Nil in 220 nm) (measured at NaNO2 at 360 nm) |
Photometric range: | 0.0 ~ 200.0% T -0.301 ~ 4.000A 0.000 to 9999C |
Photometric accuracy: | ± 0.3% T ± 0.002Abs (0 - 0.5A) ± 0.004Abs (0.5 - 1A) |
Photometric repeatability: | ≤ 0.15% T 0.001Abs (0 - 0.5A) 0.002Abs (0.5 - 1A) |
Baseline flatness: | ≤ ± 0.002A (200nm ~ 1090nm) (limited to S) |
Noise: | 0.15% T |
Baseline drift: | ± 0.0009Abs / 0.5h (limited to S) (after 2h boot, 250nm and 500nm) |
Metering mode | single beam |
Monochromator | self-collimation |
Focal length | 160mm |
Grating | 1200 lines / mm |
Detector | photocell |
Spectral bandwidth | 2nm |
Wavelength setting | Touch screen input |
Wavelength range | 190 - 1100nm |
Wavelength Accuracy | ± 1nm |
Wavelength repeatability | ≤ 0.5nm |
Wavelength scanning speed | fast, medium and slow |
Light source switching wavelength | 340nm |
Stray light | ≤ 0.1% (T) (measured at Nil in 220 nm) (measured at NaNO2 at 360 nm) |
Photometric range |
0.0 ~ 200.0% T |
-0.301 ~ 4.000A | |
0.000 to 9999C | |
Photometric accuracy |
± 0.5% T |
± 0.004Abs (0 - 0.5A) | |
± 0.008Abs (0.5 - 1A) | |
Photometric repeatability |
≤0.2% T |
0.002Abs (0 - 0.5A) | |
0.004Abs (0.5 -1 A) | |
Baseline flatness | ≤ ± 0.003A (limited to S) |
Noise | 100% (T) ≤ 0.2% (T) |
0% (T) ≤ 0.1% (T) | |
Baseline drift | ± 0.004Abs / 0.5h (limited to S) |
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