Teaching Purpose Cheap Afm Atomic Force Microscope

Product Details
Customization: Available
Magnification: 100-500X
Type: Atomic Force Microscope
Manufacturer/Factory, Trading Company, Group Corporation

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  • Teaching Purpose Cheap Afm Atomic Force Microscope
  • Teaching Purpose Cheap Afm Atomic Force Microscope
  • Teaching Purpose Cheap Afm Atomic Force Microscope
  • Teaching Purpose Cheap Afm Atomic Force Microscope
  • Teaching Purpose Cheap Afm Atomic Force Microscope
  • Teaching Purpose Cheap Afm Atomic Force Microscope
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  • Overview
  • Product Description
  • Detailed Photos
  • Product Parameters
  • Packaging & Shipping
  • Company Profile
  • Certifications
  • FAQ
Overview

Basic Info.

Model NO.
AFM1000
Mobility
Desktop
Stereoscopic Effect
Stereoscopic Effect
Kind of Light Source
Laser
Shape
Ball, Hemisphere
Usage
Research
Principle
Optics
Principle of Optics
Phase Contrast Microscope
Item
Atomic Force Microscope
Scan Angle
0~360 °
Sample Size
Dia:90 mm;H≤20 mm
Sample Movement
0~20 mm
Max. Scan Range
X/Y: 50 Um, Z: 5 Um
Pulse Width of Approaching Motor
10±2 Ms
Resolution
X/Y: 0.2 Nm, Z: 0.05nm
Optical System
Magnification: 10X, Resolution: 1um
Scan Rate
0.6 Hz~4.34 Hz
Data Points
256×256, 512×512
Transport Package
1 Set/Sets
Specification
ISO, CE
Trademark
NANBEI
Origin
Henan, China (Mainland)
HS Code
9012100000
Production Capacity
500 Set/Sets a Month

Product Description

Product Description

Teaching purpose afm atomic force microscope

 
All-in-one design, smart structure and shape.Scan head and sample stage are designed together, strong anti-vibration performance .Precision laser detection and probe alignment device make laser adjustment simple and easy.

Adapt servomotor to drive the sample approaching tip manually or automatically, to realize precision scanning area positioning.

High-accuracy and large range sample transfer device allow to scan any interesting area of sample ;Different types of scanner meets different customer's requirements in accuracy and scan size;optical observation system for tip check and sample positioning.

CCD observing system for real-time sample area observing and position;Use servomotor to achieve CCD auto-focusing Electronic system is designed as modular and easy for maintenance and development.Integrated with many working modes control electronics for further development.
 
I: Features
1.Integrated scanning probe and sample stag enhanced the anti-interference ability.
2.Precisionlaser and probe positioning device make changing the probe and adjusting thespot simple and convenient.
3.By using the sample probe approaching manner,the needle could perpendicular to thesample scanning.        
4.Automaticpulse motor drive control sample probe vertical approaching, to achieve precisepositioning of the scanning area.
5.Sample scanning area of interest could freely moved by using the designof high precision sample mobile device.
6.CCD observation system with opticalpositioning achieves real-time observation and positioning of the probe samplescan area.
7.Thedesign of electronic control system of modularization facilitated maintenanceand continuous improvement of circuit.
8.Theintegration of multiple scanning mode control circuit, cooperate with softwaresystem.
9.Spring suspension which simple and practical enhanced anti-interference ability.

Detailed Photos

Teaching Purpose Cheap Afm Atomic Force MicroscopeTeaching Purpose Cheap Afm Atomic Force MicroscopeTeaching Purpose Cheap Afm Atomic Force Microscope

Product Parameters

Main technical parameters

Work mode FM-tapping, optional contact, friction, phase,magnetic or     electrostatic.
Size Φ≤90mm,H≤20mm.
Scanningrange 20mmin XY direction,2mmin Z direction
Scanningresolution 0.2nm in XY direction,0.05nmin Z direction.
Movementrange of sample ±6.5mm.
Pulse width of the motor approaches 10±2ms.
Image sampling point 256×256,512×512.
Opticalmagnification 4X optical resolution 2.5mm
Scanrate 0.6Hz~4.34Hz scanangle 0°~360°
Scanningcontrol 18-bit D/A in XY direction,16-bit D/A in Z direction.
Datasampling 14-bitA/D,double16-bit A/D multi-channel synchronous    sampling
Feedback DSP digital feedback.
Feedbacksampling rate 64.0KHZ.
Computerinterface USB2.0.
Operatingenvironment Windows98/2000/XP/7/8.
 

Packaging & Shipping

Packaging & Shipping

Shipping : 3-10days after payment received
Package : Standard export package
 Teaching Purpose Cheap Afm Atomic Force Microscope

Company Profile

Teaching Purpose Cheap Afm Atomic Force Microscope

Certifications

Teaching Purpose Cheap Afm Atomic Force Microscope

FAQ

FAQ
Q1: Why Choose NANBEI ?
(1).Professional manufacturer with more than 13 years experience
(2).Exported to more than 97% Countries
(3).Turnkey Solution is no problem

Q2:OEM,ODM acceptable or not?
Absolutely Yes

Q3:What's kind of Payment terms for customer choosing?
T/T ,Western Union, Money Gram , Credit Card, Paypal , L/C ...

Q4:Can we visit your factory online?
Absolutely no problem

Q5:Can online video inspection before shipment?
Absolutely no problem

Q6: what's the MOQ ? Sample order is OK?
MOQ:1 set, sample order is no problem

Q7:What's kind of shipment for customer choosing?
Usually ship by sea, by air, by international express .
We can also provide reasonable solutions according to your transportation requirements

Q8:How to ensure product quality and after-sales service?
We have CE, ISO quality certificate, and SGS authentication.

After-sale service:
1.Warranty : 1 year
2.We supply free part for quality problem in warranty
3.Long life technical support and service



 

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