Customization: | Available |
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After-sales Service: | Online Technical Support |
Application: | Laboratory Apparatus |
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Technical indicators:
Industries:
Grain, Oilseed Processing,Flow Milling, StarchProduction, Sugar Production, Ethanol Production,Raw Material of Feed, Feed Final Products
Parameters:
Moisture, Protein, FatOil, Ash, Fiber,Starch,Amino Acid, Sugar, Dry Matter and more
Models | NIR2720 | NIR2750 |
Wavelength range | 1000~1800nm | 1000~2500nm |
Light source | Tungsten halogen lamp with expected lifespan more than 5,000 hours, User changeable via specific disassemble tool | |
Measurement mode | Diffuse reflectance | |
Detector | High Performance ultra- cooled InGaAs (Indium Gallium Arsenide) detecor to -25ºC, dual stage temperature stabilized | |
Optical brandwith | 10.95 ±0.3 nm @ 1395.5 nm | |
Background noise | Less than 50uA | |
Sample volume | Flexiable 50-150ml,3types of sample cups | |
Analysis time | 6-10 sec. (30 scans / sample =6s, scan speed= 5 times/ sec.) | |
Wavelength accuracy | <0.1 nm to traceable standard reference material |
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Ambinet temperature | 5-35ºC | |
Ambient humidity | 5~85 %RH | |
Power supply | 198-242V,50Hz,0.5A | |
Dimensions | 41*40*38cm | |
Weight | 18kg |
metering mode | double beam |
Monochromator | Czerny - Turner |
Focal length | 200mm |
Grating | 1600 lines / mm |
Detector | photocell |
Spectral bandwidth | 2nm |
Wavelength setting | Touch screen input |
Wavelength range | 190 - 1100nm |
Wavelength Accuracy | ± 0.3nm |
Wavelength repeatability | ≤ 0.1nm |
Wavelength scanning speed | fast, medium and slow |
Light source switching wavelength | 340nm |
Stray light | ≤ 0.02% (measured by NaI at 220 nm) (measured at NaNO2 at 360 nm) |
Photometric range: | 0.0 ~ 200.0% T -0.301 ~ 4.000A 0.000 to 9999C |
Photometric accuracy: | ± 0.3% T ± 0.002Abs (0 - 0.5A) ± 0.004Abs (0.5 - 1A) |
Photometric repeatability: | ≤ 0.15% T 0.001Abs (0 - 0.5A) 0.002Abs (0.5 - 1A) |
Baseline flatness: | ≤ ± 0.0008A |
Noise: | 0.1% T |
Baseline drift: | ± 0.0004 (A / h) at 250nm and 500nm (preheat for 2 hours) |
Power supply voltage: | AC220V ± 22V 50Hz ± 1Hz |
Power: | 200W |
metering mode | the proportion of dual-beam |
Monochromator | Czerny - Turner |
Focal length | 160mm |
Grating | 1200 lines / mm |
Detector | photocell |
Spectral bandwidth | 2nm |
Wavelength setting | Touch screen input |
Wavelength range | 190 - 1100nm |
Wavelength Accuracy | ± 0.5nm |
Wavelength repeatability | ≤ 0.2nm |
wavelength scanning speed | fast, medium and slow (limited to S models) |
Light source switching wavelength | 340nm |
Stray light | ≤ 0.03% (T) (measured at Nil in 220 nm) (measured at NaNO2 at 360 nm) |
Photometric range: | 0.0 ~ 200.0% T -0.301 ~ 4.000A 0.000 to 9999C |
Photometric accuracy: | ± 0.3% T ± 0.002Abs (0 - 0.5A) ± 0.004Abs (0.5 - 1A) |
Photometric repeatability: | ≤ 0.15% T 0.001Abs (0 - 0.5A) 0.002Abs (0.5 - 1A) |
Baseline flatness: | ≤ ± 0.002A (200nm ~ 1090nm) (limited to S) |
Noise: | 0.15% T |
Baseline drift: | ± 0.0009Abs / 0.5h (limited to S) (after 2h boot, 250nm and 500nm) |
Metering mode | single beam |
Monochromator | self-collimation |
Focal length | 160mm |
Grating | 1200 lines / mm |
Detector | photocell |
Spectral bandwidth | 2nm |
Wavelength setting | Touch screen input |
Wavelength range | 190 - 1100nm |
Wavelength Accuracy | ± 1nm |
Wavelength repeatability | ≤ 0.5nm |
Wavelength scanning speed | fast, medium and slow |
Light source switching wavelength | 340nm |
Stray light | ≤ 0.1% (T) (measured at Nil in 220 nm) (measured at NaNO2 at 360 nm) |
Photometric range |
0.0 ~ 200.0% T |
-0.301 ~ 4.000A | |
0.000 to 9999C | |
Photometric accuracy |
± 0.5% T |
± 0.004Abs (0 - 0.5A) | |
± 0.008Abs (0.5 - 1A) | |
Photometric repeatability |
≤0.2% T |
0.002Abs (0 - 0.5A) | |
0.004Abs (0.5 -1 A) | |
Baseline flatness | ≤ ± 0.003A (limited to S) |
Noise | 100% (T) ≤ 0.2% (T) |
0% (T) ≤ 0.1% (T) | |
Baseline drift | ± 0.004Abs / 0.5h (limited to S) |
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