Henan, China
Business Type:
Manufacturer/Factory, Trading Company
Management System Certification:
ISO 9000
OEM/ODM Service
Sample Available

Afm Microscopy, Atomic Force Microscopy, Research Afm Microscopu manufacturer / supplier in China, offering Scientific Research Afm Atomic Force Microscopy, Magnetic Stirring in Situ Sterilization Glass Fermenter, Water Analyzing Lab Using pH Sensor and so on.

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Scientific Research Afm Atomic Force Microscopy

Get Latest Price
Min. Order / Reference FOB Price
1 Set US $13,000-15,000/ Set
Port: Shanghai, China
Production Capacity: 200set a Month
Payment Terms: L/C, T/T, D/P, Western Union, Money Gram
Magnification: 4X
Type: Stereomicroscope
Number of Cylinder: No
Mobility: Desktop
Stereoscopic Effect: Stereoscopic Effect
Kind of Light Source: Laser

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Basic Info

Model NO.: 6800
Shape: Pentagonal Prism
Usage: Teaching
Principle: Optics
Principle of Optics: Phase Contrast Microscope
Name: Atomic Force Microscopy
Work Mode: FM-Tapping, Optional Contact, Friction, Phase,Magn
Size: 90mm*20m
Scanningrange: 20 Mmin Xydirection,2 mm in Z Direction.
Movementrange of Sample: ±6.5mm
Image Sampling Point: 256*256,512*512
Optical Magnification: 4X
Scanrate: 0.6Hz~4.34Hz
Scanangle: 0°~360°
Feedback: DSP Digital Feedback
Trademark: nanbei
Transport Package: Wooden Case Package
Specification: 54*55*99cm
Origin: China(Mainland)
HS Code: 9012100000

Product Description

Scientific research afm atomic force microscopy

 Integrated scanning probe and sample stagenhanced the anti-interference ability.
2  Precision laser and probe positioning device make changing the probe andadjusting the spot simple and convenient.
3. By using the sample probe approaching manner,the needle could perpendicular to thesample scanning.       
4.   Automaticpulse motor drive control sample probe vertical approaching, to achieve precisepositioning of the scanning area.
5.   Samplescanning area of interest could freely moved by using the design of highprecision sample mobile device.
6.   CCDobservation system with optical positioning achieves real-time observation andpositioning of the probe sample scan area.
7.   Thedesign of electronic control system of modularization facilitated maintenanceand continuous improvement of circuit.
8.   Theintegration of multiple scanning mode control circuit, cooperate with softwaresystem.
9.    Spring suspension which simple and practicalenhanced anti-interference ability.

Work modeFM-Tapping, optional contact, friction, phase,magnetic or electrostatic
Scanning range20 mmin XYdirection,2 mm in Z direction
Scanning resolution0.2nm in XY direction,0.05nm in Z direction
Movementrange of sample±6.5mm
Pulse width ofthe motor approaches10±2ms
Image sampling point256×256,512×512
optical magnification4X,opticalresolution 2.5 mm
Scan rate0.6Hz~4.34Hz,scanangle 0°~360°
Scanning control18-bit D/A in XY direction,16-bit D/A in Z direction
Data sampling14-bitA/D,double16-bit A/D multi-channel synchronous sampling
FeedbackDSP digital feedback
Feedback sampling rate64.0KHz
Computer interfaceUSB2.0
Operating environmentWindows98/2000/XP/7/8.

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