Mini 4 Inch Manual Probe Station with Stereo Microscope

• Customization: Available
• After-sales Service: 12 Months
• Warranty: 12 Months
• Model NO.: XR400
• Magnification: 8X-50X
• Type: Stereomicroscope
• Number of Cylinder: Monocular
• Mobility: Portable
• Stereoscopic Effect: Without Stereoscopic Effect
• Kind of Light Source: Fluorescence
• Usage: Teaching, Research
• Principle: Electronic
• Probe Station Host: Xr400
• Chuck Size: 4 Inch
• Chuck X/Y Displacement Range: 4 Inch X 4 Inch
• Chuck Displacement Mode: Precision Displacement of Screw Rod
• Chuck Surface Material: Aluminum Alloy, Stainless Steel, Gold Plated, Nick
• Chuck Temperature Control: Pid Control Heating Chuck, Maximum Temperature 200
• Sample Fixing Method: Vacuum Adsorption, Customized Card Slot
• Number of Probe Seats: 4-6 Probe Seats Can Be Placed
• Probe Table Size: About 450X320X500mm(L*W*H)
• Microscope Type: Stereo Microscope
• Microscope Displacement Range: Lifting 50mm
• Light Source: LED Light Source, Coaxial Light Source, Cold Light
• Industrial Camera: Optional HD 1080P/720p; with Photo, Video and Meas
• Probe Base: MP-01
• Transport Package: 800× 800× 800mm
• Specification: 60kg weight
• Trademark: NANBEI
• Origin: Zhengzhou, China
• HS Code: 8419899090
• Production Capacity: 1000 Set/Sets a Month

Product Description

Mini 4 inch Manual Probe Station with Stereo Microscope

Product Description

Manual Probe Station,
Mini Probe Station System,
Used for testing 4-inch wafers, MEMS, IC and other devices.

The standard probe stand is suitable for 4-inch wafer testing, and can also be used for testing single devices or samples.
Commonly used for I/V, C/V, C/F, RF S parameters, active test, voltage withstand test, ESD test, mixed parameter test, etc; The interface is compatible with mainstream testing instruments.

Devices that can be used for testing, such as CMOS transistors, bipolar transistors, discrete devices, memories, power devices, nano devices, etc;
Application scenarios include chip testing, optoelectronic material testing, or device reliability testing, failure analysis, etc.

Main features:
·High and low temperature test environment is available
·Chuck can be gold-plated or insulated ceramic
·RF test, I/V test, etc
·Compatible with body microscope and single tube microscope
·Customized version can be equipped with high-end metallographic microscope
·It can be equipped with photo, video and measurement functions
·Customized version can provide the whole table design
·Compact and space saving
Semiconductor parameter analyzer                     Digital Source                                            Table network analyzer

Application
Suitable for DC and RF parameter test
Equip the instrument according to the test requirements, provide multiple connector types, and be compatible with mainstream instruments

Test sample:
Wafer                                                         chip                                               Micro device                                 Circuit module

1.Microscopic adjustment

•The height can be adjusted freely and can be rotated at any angle
• Support customization, compatible with conventional microscope
• Bracket with limit device

2. Probe base

• High strength magnetic switch base
• Needle holder arm can be adjusted at 0~30 degrees
• Upgradeable to RF probe base
• Three axis linear movement, precision micrometer adjustment

3.Probe table

• U-shaped table top widening design
• Supports up to 4 RF probe holders
• Supports up to 6 DC probe holders
• Fine polishing of worktop

4.High strength base

•Scientific design, compact structure, stable and reliable

5.Microscope unit

• Total magnification: 8X - 200X (2X auxiliary objective lens)
• Single tube microscope, body microscope
• Optional LED light source or coaxial light source
• Eyepiece 10X or 20X;
• Magnification: 0.8 - 5X

6.Stage unit

• Optional independent vacuum adsorption function
• Aluminum alloy material, gold plated or ceramic
• Upgradeable to heating chuck
• Temperature range: normal temperature~500 ºC
• X-Y motion stroke: 4 inches * 4 inches
• Chuck can be rotated to fine tune 0~15 °
• Chuck fine adjustment lifting, maximum stroke 10mm

7.Operating handle

• Aluminum alloy material, comfortable to handle
• Surface precision electroplating

Details Images

Triocular microscope
The standard magnification is 8~50X, and the maximum magnification is 200X. It can be connected to a CCD high-definition industrial camera to display the picture on the large LCD screen. It is convenient for testing and observation, with one button photographing and video recording functions, and convenient for saving test data.
 

Precision U-shaped table top
The table top is made of high-quality stainless steel, which can give consideration to conventional magnetic switch base and vacuum adsorption base. The table top is widened to accommodate 6 MP-01 DC probe bases or 4 RF bases. It is convenient for multi-point testing.
 

Magnetic switch base
MP-01 magnetic switch base is standard. The base adopts high strength magnetic core. The needle base arm is provided with tilt angle adjustment, which is precisely adjusted by the micrometer, with a range of 0~30 degrees.
 

Electroplated handle
Aluminum alloy handle, with fine surface treatment and high-quality electroplating process.
 

Product Parameters

Parameter data:

Probe station host	XR400
Chuck size	4 inch
Chuck X/Y displacement range	4 inch x 4 inch
Chuck displacement mode	Precision displacement of screw rod
Chuck surface material	Aluminum alloy, stainless steel, gold plated, nickel plated or ceramic
Chuck temperature control	PID control heating chuck, maximum temperature 200 °/300 °/500 °
Sample fixing method	Vacuum adsorption, customized card slot
Number of probe seats	4-6 probe seats can be placed
Probe table size	About 450x320x500mm(L*W*H)
Microscope type	Stereo Microscope
Magnification	8x-50x
Microscope displacement range	Lifting 50mm
Light source	LED light source, coaxial light source, cold light source
Industrial camera	Optional HD 1080P/720P; With photo, video and measurement functions
Probe base	MP-01
Fixed type	Magnetic adsorption, vacuum adsorption (optional)
Moving accuracy	±1.5um
Tilt angle	Maximum 30° fine adjustment, micrometer adjustment
Probe clamp	Coaxial tip holder
Leakage accuracy	About 10pA
Connect type	Coaxial connector
Probe tip radius	0.5um/1um/2um/5um/10um/20um/50um/100um(optional)
Probe material	Tungsten steel/beryllium copper
Optical isolation platform	Damping isolation/air bearing isolation (optional)
Platform size	1000x800x800mm(L*W*H)
Shielding box	PBX-4-XR1,suit 4 inch probe station(optional)

Please send us an inquiry if you want other configuration!

Packaging & Shipping

Company Profile

FAQ

Q1: Why Choose NANBEI ?
(1).Professional manufacturer with more than 14 years experience
(2).Exported to more than 97% Countries
(3).Turnkey Solution is no problem

Q2:OEM,ODM acceptable or not?
Absolutely Yes

Q3:What's kind of Payment terms for customer choosing?
T/T ,Western Union, Money Gram , Credit Card, Paypal , L/C ...

Q4:Can we visit your factory online?
Absolutely no problem

Q5:Can online video inspection before shipment?
Absolutely no problem

Q6: what's the MOQ ? Sample order is OK?
MOQ:1 set, sample order is no problem

Q7:What's kind of shipment for customer choosing?
Usually ship by sea, by air, by international express .
We can also provide reasonable solutions according to your transportation requirements

Q8:How to ensure product quality and after-sales service?
We have CE, ISO quality certificate, and SGS authentication.

After-sale service:

1. Warranty : 1 year
2. We supply free part for quality problem in warranty
3. Long life technical support and service