Customization: | Available |
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After-sales Service: | on Line Service |
Application: | Laboratory Apparatus |
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Uv/vis spectrophotometer price china with certificated
N4S / N4 UV-Vis spectrophotometer, combined with ARM processing core, automatic wavelength so that the instrument has a high-end instrument test speed and function. Which can meet the qualitative and quantitative analysis of the vast majority of UV-visible spectral ranges in conventional laboratories. Suitable for medical and health, clinical testing, biochemistry, petrochemical, environmental protection, quality control and tertiary institutions and other departments.
main feature:
7-inch color touch screen and patented technology to achieve a simple and effective human-computer interaction at the same time, clearly show the test data and scan results.
USB communication port and optional UVwin8 UV spectrum software, to achieve data and map processing functions, as well as massive data storage, and for the customer's secondary development to facilitate.
Full-band scanning (limited to S), sub-band scanning (limited to S), dynamic time scanning, automatic wavelength, linear regression, concentration direct reading, peak and valley detection, timing printing and other functions.
advanced power protection measures, you can remember the test data, scan map (limited to S models), regression equations and instrument correction parameters, to achieve rapid initialization.
With halogen and lamp life protection.
Optional:
Built-in thermal printer (N4S only)
UVwin8 UV spectrum software
Other:
Light source: 12V 20W halogen lamp and long life lamp
Power supply voltage: AC220V ± 22V 50Hz ± 1Hz
Power: 180W
Model | N4S |
Grating: | 1200 lines / mm |
Detector: | photocell |
Spectral bandwidth: | 2nm |
Wavelength setting: | Touch screen input |
Wavelength range: | 190 - 1100nm |
Wavelength Accuracy: | ± 1nm |
Wavelength repeatability: | ≤ 0.5nm |
Wavelength scanning speed: | fast, medium and slow |
Light source switching wavelength: | 340nm |
Stray light: | ≤ 0.1% (T) (measured at Nil in 220 nm) (measured at NaNO2 at 360 nm) |
Photometric range: | 0.0 ~ 200.0% T |
0.301 ~ 4.000A | |
0.000 to 9999C | |
Photometric accuracy: | ± 0.5% T |
± 0.004Abs (0 - 0.5A) | |
± 0.008Abs (0.5 - 1A) | |
Photometric repeatability: | ≤0.2% T |
0.002Abs (0 - 0.5A) | |
0.004Abs (0.5 -1 A) | |
Baseline flatness: | ≤ ± 0.003A (limited to S) |
Noise: 100% (T) | ≤ 0.2% (T) |
0% (T) | ≤ 0.1% (T) |
Baseline drift: | ± 0.004Abs / 0.5h (limited to S) |
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