Henan, China
Business Type:
Manufacturer/Factory, Trading Company
Management System Certification:
ISO 9000
OEM/ODM Service
Sample Available

Afm Microscope, Atomic Force Microscope, Research Afm Microscope manufacturer / supplier in China, offering Solid Surface Research Machine Atomic Force Microscope, Magnetic Stirring in Situ Sterilization Glass Fermenter, Water Analyzing Lab Using pH Sensor and so on.

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Solid Surface Research Machine Atomic Force Microscope

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Min. Order / Reference FOB Price
1 Set US $9,500-15,000/ Set
Port: Shanghai, China
Production Capacity: 200set a Month
Payment Terms: L/C, T/T, D/P, Western Union, Money Gram
Magnification: 4X
Type: Stereomicroscope
Number of Cylinder: No
Mobility: Desktop
Stereoscopic Effect: Stereoscopic Effect
Kind of Light Source: Laser

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Basic Info

Model NO.: AFM
Shape: Pentagonal Prism
Usage: Teaching
Principle: Optics
Principle of Optics: Phase Contrast Microscope
Name: Atomic Force Microscope
Work Mode: FM-Tapping, Optional Contact, Friction, Phase,Magn
Size: 90mm*20m
Scanningrange: 20 Mmin Xydirection,2 mm in Z Direction.
Movementrange of Sample: ±6.5mm
Image Sampling Point: 256*256,512*512
Optical Magnification: 4X
Scanrate: 0.6Hz~4.34Hz
Scanangle: 0°~360°
Feedback: DSP Digital Feedback
Trademark: nanbei
Transport Package: Wooden Case Package
Specification: 54*55*99cm
Origin: China(Mainland)
HS Code: 9012100000

Product Description

Solid surface research machine atomic force microscope

 Integrated scanning probe and sample stagenhanced the anti-interference ability.
2  Precision laser and probe positioning device make changing the probe andadjusting the spot simple and convenient.
3. By using the sample probe approaching manner,the needle could perpendicular to thesample scanning.       
4.   Automaticpulse motor drive control sample probe vertical approaching, to achieve precisepositioning of the scanning area.
5.   Samplescanning area of interest could freely moved by using the design of highprecision sample mobile device.
6.   CCDobservation system with optical positioning achieves real-time observation andpositioning of the probe sample scan area.
7.   Thedesign of electronic control system of modularization facilitated maintenanceand continuous improvement of circuit.
8.   Theintegration of multiple scanning mode control circuit, cooperate with softwaresystem.
9.    Spring suspension which simple and practicalenhanced anti-interference ability.

Work mode: FM-Tapping, optional contact, friction, phase,magnetic or electrostatic
3,Scanningrange:20 mmin XYdirection,2 mm in Z direction.
4,Scanningresolution:0.2nm in XY direction,0.05nm in Z direction.
5,Movementrange of sample:±6.5mm.
6,Pulse width ofthe motor approaches:10±2ms.
7,Image sampling point:256×256,512×512.
8,  optical magnification 4X,opticalresolution 2.5 mm.
9,Scanrate 0.6Hz~4.34Hz,scanangle 0°~360°.
10,Scanningcontrol : 18-bit D/A in XY direction,16-bit D/A in Z direction.
11,Datasampling:14-bitA/D,double16-bit A/D multi-channel synchronous sampling.
12,Feedback:DSP digital feedback.
13,Feedbacksampling rate:64.0KHz.

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