| Customization: | Available |
|---|---|
| After-sales Service: | Yes |
| Warranty: | 12months |
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Education design afm atomic force microscope

MAIN SPECIFICATIONS:
| Work mode | FM-Tapping, optional contact, friction, phase,magnetic or electrostatic |
| Size | Φ≤90mm,H≤20mm |
| Scanningrange | 20 mmin XYdirection,2 mm in Z direction |
| Scanningresolution | 0.2nm in XY direction,0.05nm in Z direction |
| Movementrange of sample | ±6.5mm |
| Pulse width ofthe motor approaches | 10±2ms |
| Image sampling point | 256×256,512×512. |
| optical magnification | 4X |
| opticalresolution | 2.5 um |
| Scanrate | 0.6Hz~4.34Hz |
| scanangle | 0°~360° |
| Scanningcontrol | 18-bit D/A in XY direction,16-bit D/A in Z direction. |
| Datasampling | 14-bitA/D,double16-bit A/D multi-channel synchronous sampling. |
| Feedback | DSP digital feedback |
| Feedbacksampling rate | 64.0KHz |
| Computerinterface | USB2.0. |
| Operatingenvironment | Windows98/2000/XP/7/8 |

FAQ
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