All-in-One Lab Atomic Force Microscope

Product Details
Customization: Available
After-sales Service: Yes
Warranty: 12months
Manufacturer/Factory, Trading Company, Group Corporation

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  • All-in-One Lab Atomic Force Microscope
  • All-in-One Lab Atomic Force Microscope
  • All-in-One Lab Atomic Force Microscope
  • All-in-One Lab Atomic Force Microscope
  • All-in-One Lab Atomic Force Microscope
  • All-in-One Lab Atomic Force Microscope
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  • Overview
  • Product Description
  • Product Parameters
  • Detailed Photos
  • Packaging & Shipping
  • Company Profile
  • Certifications
  • FAQ
Overview

Basic Info.

Model NO.
FM-Nanoview Tapping
Magnification
100-500X
Type
Atomic Force Microscope
Number of Cylinder
No
Mobility
Desktop
Stereoscopic Effect
Stereoscopic Effect
Kind of Light Source
Laser
Shape
Ball, Hemisphere
Usage
Research
Principle
Optics
Principle of Optics
Phase Contrast Microscope
Item
All-in-One Lab Atomic Force Microscope
Sample Movement
0~20 mm
Max. Scan Range
X/Y: 50 Um, Z: 5 Um
Resolution
X/Y: 0.2 Nm, Z: 0.05nm
Optical System
Magnification: 10X, Resolution: 1um
Scan Rate
0.6 Hz~4.34 Hz
Scanning Angle
360degree
Basic Working Mode
Contact Mode, Tapping Mode, F-Z Force Curve Measur
Optional Working Mode
Friction / Lateral Force, Amplitude / Phase, Magne
Sample Size
Φ<90mm, H < 20mm
Sample Moving Range
15X15mm
Optical Magnification
4X
Scan Control
Xy Uses 18-Bit D/a, Z Uses 16-Bit D/a
Data Sampling
14-Bit a/D, Dual 16-Bit a/D Multi-Channel
Feedback Method
DSP Digital Feedback
Transport Package
1 Set/Sets
Specification
ISO, CE
Trademark
NANBEI
Origin
Henan, China (Mainland)
HS Code
9012100000
Production Capacity
500 Set/Sets a Month

Product Description

Product Description

All-in-One Lab Atomic Force Microscope

 
All-in-one design, smart structure and shape.Scan head and sample stage are designed together, strong anti-vibration performance .Precision laser detection and probe alignment device make laser adjustment simple and easy.Adapt servomotor to drive the sample approaching tip manually or automatically, to realize precision scanning area positioning.High-accuracy and large range sample transfer device allow to scan any interesting area of sample ;Different types of scanner meets different customer's requirements in accuracy and scan size;optical observation system for tip check and sample positioning.CCD observing system for real-time sample area observing and position;Use servomotor to achieve CCD auto-focusing Electronic system is designed as modular and easy for maintenance and development.Integrated with many working modes control electronics for further development.
 
 Features
1.Integrated scanning probe and sample stag enhanced the anti-interference ability.
2.Precisionlaser and probe positioning device make changing the probe and adjusting thespot simple and convenient.
3.By using the sample probe approaching manner,the needle could perpendicular to thesample scanning.        
4.Automaticpulse motor drive control sample probe vertical approaching, to achieve precisepositioning of the scanning area.
5.Sample scanning area of interest could freely moved by using the designof high precision sample mobile device.
6.CCD observation system with opticalpositioning achieves real-time observation and positioning of the probe samplescan area.
7.Thedesign of electronic control system of modularization facilitated maintenanceand continuous improvement of circuit.
8.Theintegration of multiple scanning mode control circuit, cooperate with softwaresystem.
9.Spring suspension which simple and practical enhanced anti-interference ability.

 

Product Parameters

Main technical parameters

Work mode FM-tapping, optional contact, friction, phase,magnetic or     electrostatic.
Size Φ≤90mm,H≤20mm.
Scanningrange 20mmin XY direction,2mmin Z direction
Scanningresolution 0.2nm in XY direction,0.05nmin Z direction.
Movementrange of sample ±6.5mm.
Pulse width of the motor approaches 10±2ms.
Image sampling point 256×256,512×512.
Opticalmagnification 4X optical resolution 2.5mm
Scanrate 0.6Hz~4.34Hz scanangle 0°~360°
Scanningcontrol 18-bit D/A in XY direction,16-bit D/A in Z direction.
Datasampling 14-bitA/D,double16-bit A/D multi-channel synchronous    sampling
Feedback DSP digital feedback.
Feedbacksampling rate 64.0KHZ.
Computerinterface USB2.0.
Operatingenvironment Windows98/2000/XP/7/8.
 

Detailed Photos

All-in-One Lab Atomic Force Microscope

All-in-One Lab Atomic Force MicroscopeAll-in-One Lab Atomic Force Microscope

All-in-One Lab Atomic Force Microscope

All-in-One Lab Atomic Force Microscope

Packaging & Shipping

All-in-One Lab Atomic Force Microscope

Company Profile

All-in-One Lab Atomic Force Microscope

Certifications

All-in-One Lab Atomic Force Microscope

FAQ

 

FAQ     

1. How can I choose the suitable one?
Dear customer, please tell us your detailed requirements by mail or online, we will recommend the suitable one as your request.
2. Does your price is competitive?
Dear customer, we make sure to offer you the best quality with competitive price.
3. How can I pay?
Dear customer, we accept many payment term, such as T/T, Western Union…
4. When I receive it after pay?
Dear customer, normal models can be delivered with 5-7days, please contact us to check transport time to your address.
5. How to deliver?
Dear customer, we can send by Express, by Sea and by Air.
6. Is will be broken during transport?
Dear customer, please do not worry, we do standard export package.
7. What should I do if I do not know how to use?
Dear customer, please do not worry, manual user will be sent together, you can also contact us with more technological support.
8. What should I do if some parts broken?
Dear customer, please do not worry, we have 12months warranty except  wear parts. You can also buy parts from us after 12months.

 

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